Journal
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 143, Issue -, Pages 406-410Publisher
ELSEVIER
DOI: 10.1016/j.solmat.2015.07.027
Keywords
Quantitative evaluation; Photocurrent imaging; Lock-in thermography; 2D device simulation; Local analysis
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The most straightforward way to map the photo-induced short circuit current density (J(sc)) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for J(sc) imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This letter reports an alternative method for J(sc) imaging, which is solely based on the evaluation of dark lock-in thermography images. This method is particularly advantageous to improve the accuracy of dark lock-in thermography based local efficiency analysis of solar cells. (C) 2015 Elsevier B.V. All rights reserved.
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