Related references
Note: Only part of the references are listed.
Article
Materials Science, Multidisciplinary
Recent advances in electron tomography:: TEM and HAADF-STEM tomography for materials science and semiconductor applications
C Kübel et al.
MICROSCOPY AND MICROANALYSIS (2005)
Article
Materials Science, Multidisciplinary
Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions
AC Twitchett et al.
MICROSCOPY AND MICROANALYSIS (2005)
Article
Materials Science, Multidisciplinary
Extending energy-filtered transmission electron microscopy (EFTEM) into three dimensions using electron tomography
M Weyland et al.
MICROSCOPY AND MICROANALYSIS (2003)