Journal
NATURE MATERIALS
Volume 7, Issue 2, Pages 134-137Publisher
NATURE PUBLISHING GROUP
DOI: 10.1038/nmat2096
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Imaging with visible light today uses numerous contrast mechanisms, including bright-and dark-field contrast, phase-contrast schemes and confocal and fluorescence-based methods(1). X-ray imaging, on the other hand, has only recently seen the development of an analogous variety of contrast modalities. Although X-ray phase-contrast imaging could successfully be implemented at a relatively early stage with several techniques(2)-(11), dark-field imaging, or more generally scattering-based imaging, with hard X-rays and good signal-to-noise ratio, in practice still remains a challenging task even at highly brilliant synchrotron sources(12-18). In this letter, we report a new approach on the basis of a grating interferometer that can efficiently yield dark-field scatter images of high quality, even with conventional X-ray tube sources. Because the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micrometre and submicrometre length scale. Our approach is fully compatible with conventional transmission radiography and a recently developed hard-X-ray phase-contrast imaging scheme(11). Applications to X-ray medical imaging, industrial non-destructive testing and security screening are discussed.
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