Journal
NANOTECHNOLOGY
Volume 23, Issue 47, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/23/47/475708
Keywords
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Funding
- 'Analytical Platform of the Swiss Competence Center for Materials Research and Technology (CCMX)' of the ETH Domain
- Empa Forschungskommission
- PSI Forschungskommission
- CCMX
- Bundesministerium fur Bildung und Forschung [05KS7WE1, 05K10WEA]
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A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples.
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