Journal
NANOTECHNOLOGY
Volume 23, Issue 10, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/23/10/105703
Keywords
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Funding
- Spanish Ministry of Science [MAT2008-06567-C02, MAT2011-27553-C02]
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Scanning transmission x-ray microscopy (STXM) and magnetoresistance (MR) measurements are used to investigate the magnetic behavior of a nanoconstriction joining two micrometric electrodes (a pad and a wire). The reversal of the magnetization under variable external static magnetic fields is imaged. By means of a detailed analysis of the STXM images at the nanocontact area, the MR is calculated, based on diffusive anisotropic-MR. This MR agrees well with that obtained from electrical transport measurements, allowing a direct correlation between the MR signal and the magnetic reversal of the system. The magnetization behavior depends on the sample thickness and constriction dimensions. In 40 nm-thick samples, with 20 x 175 nm(2) contact areas, the magnetization at the two sides of the constriction forms a net angle of 90 degrees, with a progressive evolution of the magnetization structure between the electrodes during switching. The MR in those cases has a more peaked shape than with 20 nm-thick electrodes and 10 x 80 nm(2) contact areas, where the magnetization forms 180 degrees between them, with a wide domain wall pinned at the constriction. As a consequence of this configuration, a plateau in the MR is observed for about 20 Oe.
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