Related references
Note: Only part of the references are listed.Ultra-Sensitive Capacitive Detection Based on SGMOSFET Compatible With Front-End CMOS Process
Eric Colinet et al.
IEEE JOURNAL OF SOLID-STATE CIRCUITS (2009)
Self-oscillation conditions of a resonant nanoelectromechanical mass sensor
Eric Colinet et al.
JOURNAL OF APPLIED PHYSICS (2009)
Carbon Nanotubes as Ultrahigh Quality Factor Mechanical Resonators
Andreas K. Huttel et al.
NANO LETTERS (2009)
Compact and explicit physical model for lateral metal-oxide-semiconductor field-effect transistor with nanoelectromechanical system based resonant gate
L. Duraffourg et al.
APPLIED PHYSICS LETTERS (2008)
Monolithic CMOS MEMS oscillator circuit for sensing in the attogram range
J. Verd et al.
IEEE ELECTRON DEVICE LETTERS (2008)
Ultrasensitive Mass Sensing with a Nanotube Electromechanical Resonator
B. Lassagne et al.
NANO LETTERS (2008)
An atomic-resolution nanomechanical mass sensor
K. Jensen et al.
NATURE NANOTECHNOLOGY (2008)
A self-sustaining ultrahigh-frequency nanoelectromechanical oscillator
X. L. Feng et al.
NATURE NANOTECHNOLOGY (2008)
Self-oscillations in field emission nanowire mechanical resonators: A nanometric dc-ac conversion
Anthony Ayari et al.
NANO LETTERS (2007)
Micro- and nanosystems for biology and medicine
U. Staufer et al.
MICROELECTRONIC ENGINEERING (2007)
Efficient electrothermal actuation of multiple modes of high-frequency nanoelectromechanical resonators
I. Bargatin et al.
APPLIED PHYSICS LETTERS (2007)
Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications
Mo Li et al.
NATURE NANOTECHNOLOGY (2007)
Giant piezoresistance effect in silicon nanowires
Rongrui He et al.
NATURE NANOTECHNOLOGY (2006)
Zeptogram-scale nanomechanical mass sensing
YT Yang et al.
NANO LETTERS (2006)
Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement
Y Ju et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2005)
Attogram detection using nanoelectromechanical oscillators
B Ilic et al.
JOURNAL OF APPLIED PHYSICS (2004)
Ultimate limits to inertial mass sensing based upon nanoelectromechanical systems
KL Ekinci et al.
JOURNAL OF APPLIED PHYSICS (2004)
Advances in atomic force microscopy
FJ Giessibl
REVIEWS OF MODERN PHYSICS (2003)
Balanced electronic detection of displacement in nanoelectromechanical systems
KL Ekinci et al.
APPLIED PHYSICS LETTERS (2002)
Share Paper
