4.6 Article

Current-induced domain wall nucleation and its pinning characteristics at a notch in a spin-valve nanowire

Journal

NANOTECHNOLOGY
Volume 20, Issue 12, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/20/12/125401

Keywords

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Funding

  1. Tera-level Nano Devices
  2. Korean Ministry of Science and Technology
  3. Korea Research Foundation Grant funded by the Korean Government (MOEHRD, Basic Research Promotion Fund) [KRF-2007-313-C00254]
  4. National Core Research Center at GIST
  5. Korea Ministry of Science and Technology

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The characteristics of domain wall (DW) pinning at a notch in a spin-valve nanowire were investigated when a DW was created by a current, flowing into a spin-valve nanowire. It was found that DW pinning at a notch is quite sensitive to the magnitude of the current and its polarity. The current-polarity dependence of DW pinning is likely due to the spin structure in the core of the DW, which is determined by an Oersted field from the current in a Cu layer. This indicates that the control of DW pinning at a notch in a nanowire can be achieved by a current acting on its own, which is an important advantage of this method, compared with field-induced DW control.

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