Journal
NANOTECHNOLOGY
Volume 20, Issue 8, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/20/8/085702
Keywords
-
Funding
- MEC [BFU2006-07902/BFI]
- TIN [2007-65989]
- CAM [S-SEM-0255-2006]
Ask authors/readers for more resources
A technique that combines a theoretical description of the electrostatic interaction and artificial neural networks (ANNs) is used to solve an inverse problem in scanning probe microscopy setups. Electrostatic interaction curves calculated by the generalized image charge method are used to train and validate the ANN in order to estimate unknown magnitudes in highly undetermined setups. To illustrate this technique, we simultaneously estimate the tip-sample distance and the dielectric constant for a system composed of a tip scanning over a metallic nanowire. In a second example, we use this method to quantitatively estimate the dielectric constant for an even more undetermined system where the tip shape (characterized by three free parameters) is not known. Finally, the proposed method is validated with experimental data.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available