Journal
NANOSCALE
Volume 4, Issue 2, Pages 408-413Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/c1nr11099c
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Funding
- US National Science Foundation [DMR-1006194, CMMI-1100339]
- Natural Science Foundation of China [10972189, 10902095, 11090331]
- China Scholarship Council
- NASA
- Center for Nanotechnology, University of Washington
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1006194] Funding Source: National Science Foundation
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [1100339] Funding Source: National Science Foundation
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Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO3 nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.
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