Journal
NANO RESEARCH
Volume 3, Issue 1, Pages 43-50Publisher
TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-010-1006-4
Keywords
Graphene; sublimation; in situ electron microscopy; vacancy hole; bilayer edge
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Funding
- U. S. Department of Energy [DE-AC04-94AL85000]
- Honda Research Institute USA
- NSF [CMMI-0728069]
- AFOSR
- ONR [N00014-05-1-0504]
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An individual suspended graphene sheet was connected to a scanning tunneling microscopy probe inside a transmission electron microscope, and Joule heated to high temperatures. At high temperatures and under electron beam irradiation, the few-layer graphene sheets were removed layer-by-layer in the viewing area until a monolayer graphene was formed. The layer-by-layer peeling was initiated at vacancies in individual graphene layers. The vacancies expanded to form nanometer-sized holes, which then grew along the perimeter and propagated to both the top and bottom layers of a bilayer graphene joined by a bilayer edge. The layer-by-layer peeling was induced by atom sublimation caused by Joule heating and facilitated by atom displacement caused by high-energy electron irradiation, and may be harnessed to control the layer thickness of graphene for device applications.
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