Journal
NANO RESEARCH
Volume 1, Issue 2, Pages 166-175Publisher
TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-008-8010-y
Keywords
Carbon nanotubes; boron nitride nanotubes; transmission electron microscope; scanning tunneling microscope
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Funding
- National Institute for Materials Science (NIMS)
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We have investigated the behavior of two nanotube systems, carbon and boron nitride, under controlled applied voltages in a high-resolution transmission electron microscope (TEM) equipped with a scanning tunneling microscope (STM) unit. Individual nanotubes (or thin bundles) were positioned between a piezomovable gold electrode and a biased (up to +/- 140 V) STM tip inside the pole-piece of the microscope. The structures studied include double- and multi-walled carbon nanotubes (the latter having diverse morphologies due to the various synthetic procedures utilized), few-layered boron nitride nanotube bundles and multi-walled boron nitride nanotubes (with or without functionalized surfaces). The electrical breakdown, physical failure, and electrostatic interactions are documented for each system.
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