4.8 Article

Dielectric Screening in Atomically Thin Boron Nitride Nanosheets

Journal

NANO LETTERS
Volume 15, Issue 1, Pages 218-223

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl503411a

Keywords

boron nitride nanosheets; electric field screening; electric force microscopy (EFM); first-principles calculations; nonlinear Thomas-Fermi theory

Funding

  1. Alfred Deakin Postdoctoral Research Fellowship
  2. Australian Research Council
  3. NSF [TG-DMR120049, TG-PHY120021]
  4. European project FP7-PEOPLE-2013-CIG LSIE_2D
  5. Italian National MIUR [20105ZZTSE]
  6. Italian MIUR program Progetto Premiale Project ABNANOTECH
  7. MINECO, Spain [FIS2011-23713]
  8. Grants-in-Aid for Scientific Research [26248061] Funding Source: KAKEN

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