4.8 Article

Materials Processing Routes to Trap-Free Halide Perovskites

Journal

NANO LETTERS
Volume 14, Issue 11, Pages 6281-6286

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl502612m

Keywords

Perovskite; defect; electronic traps; diffusion length; growth; precurson

Funding

  1. King Abdullah University of Science and Technology (KAUST) [KUS-11-009-21]
  2. Ontario Research Fund Research Excellence Program
  3. Natural Sciences and Engineering Research Council (NSERC) of Canada
  4. Ontario Government
  5. Canada Foundation for Innovation under the Compute Canada
  6. Government of Ontario
  7. Ontario Research Fund-Research Excellence
  8. University of Toronto

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Photovoltaic devices based on lead iodide perovskite films have seen rapid advancements, recently achieving an impressive 17.9% certified solar power conversion efficiency. Reports have consistently emphasized that the specific choice of growth conditions and chemical precursors is central to achieving superior performance from these materials; yet the roles and mechanisms underlying the selection of materials processing route is poorly understood. Here we show that films grown under iodine-rich conditions are prone to a high density of deep electronic traps (recombination centers), while the use of a chloride precursor avoids the formation of key defects (Pb atom substituted by I) responsible for short diffusion lengths and poor photovoltaic performance. Furthermore, the lowest-energy surfaces of perovskite crystals are found to be entirely trap-free, preserving both electron and hole delocalization to a remarkable degree, helping to account for explaining the success of polycrystalline perovskite films. We construct perovskite films from I-poor conditions using a lead acetate precursor, and our measurement of a long (600 +/- 40 nm) diffusion length confirms this new picture of the importance of growth conditions.

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