4.8 Article

Polarization-Resolved Near-Field Mapping of Plasmonic Aperture Emission by a Dual-SNOM System

Journal

NANO LETTERS
Volume 14, Issue 9, Pages 5010-5015

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl501431y

Keywords

Near-field optical microscopy; surface plasmon polariton; scanning probe microscopy; plasmonics; dipole

Funding

  1. Thuringian State Government (MeMa)
  2. German Federal Ministry of Education and Research (PhoNa)
  3. German Research Foundation [SPP 1391]

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We study the polarization characteristics of light emission and collection in the near field by the tips of a Dual-SNOM (two scanning near-field optical microscopes) setup. We find that cantilevered fiber probes can serve as emitters of polarized light, or as polarization-sensitive detectors. The polarization characteristics depend on the fiber type used for tip fabrication. In Dual-SNOM measurements, we demonstrate mapping of different field components of the plasmonic dipole pattern emitted by an aperture probe.

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