4.8 Article

Oxide Heterostructure Resistive Memory

Journal

NANO LETTERS
Volume 13, Issue 6, Pages 2908-2915

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl401287w

Keywords

Resistive random access memory; memristive device; oxide heterostructure; sneak path; X-ray photoelectron spectroscopy; oxygen vacancy

Funding

  1. AFOSR through MURI Grant [FA9550-12-1-0038, FA9550-12-1-0441]
  2. NSF

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Resistive switching devices are widely believed as a promising candidate for future memory and logic applications. Here we show that by using multilayer oxide heterostructures the switching characteristics can be systematically controlled, ranging from unipolar switching to complementary switching and bipolar switching with linear and nonlinear on-states and high endurance. Each layer can be tailed for a specific function during resistance switching, thus greatly improving the degree of control and flexibility for optimized device performance.

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