4.8 Article

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Journal

NANO LETTERS
Volume 13, Issue 7, Pages 3152-3156

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl401129m

Keywords

Scanning near-field optical microscopy; scanning probe; FRET; graphene; nitrogen-vacancy center; nanodiamond

Funding

  1. EU
  2. German Science foundation (DFG) [SFB/TR 21]
  3. Max-Planck society
  4. Volkswagenstiftung
  5. BMBF (CHIST-ERA QINVC)
  6. Baden-Wurttemberg Stiftung

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We present a scanning-probe microscope based on an atomic-size emitter, a single nitrogen-vacancy center in a nanodiamond. We employ this tool to quantitatively map the near-field coupling between the NV center and a flake of graphene in three dimensions with nanoscale resolution. Further we demonstrate universal energy transfer distance scaling between a point-like atomic emitter and a two-dimensional acceptor. Our study paves the way toward a versatile single emitter scanning microscope, which could image and excite molecular-scale light fields in photonic nanostructures or single fluorescent molecules.

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