4.8 Article

Mapping Impurity of Single-Walled Carbon Nanotubes in Bulk Samples with Multiplex Coherent Anti-Stokes Raman Microscopy

Journal

NANO LETTERS
Volume 13, Issue 2, Pages 697-702

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl304371x

Keywords

Coherent anti-Stokes Raman microscopy; carbon nanotubes; purity; defect; maximum entropy method

Funding

  1. Conselho Nacional de Pesquisa e Desenvolvimento Tecnologico (CNPq)
  2. Deutscher Akademischer Austauschdienst (DAAD)
  3. BMBF-Project (MEDICARS) [FKZ: 13N10778]
  4. Seventh European Framework Programme (CROSS TRAP) [244068]

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Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution.

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