4.8 Article

Tuning the Surface Charge Properties of Epitaxial InN Nanowires

Journal

NANO LETTERS
Volume 12, Issue 6, Pages 2877-2882

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl300476d

Keywords

Nanowire; InN; electron accumulation; two-dimensional electron gas; X-ray photoelectron spectroscopy; photoluminescence

Funding

  1. Natural Sciences and Engineering Research Council of Canada
  2. Fonds de recherche sur la nature et les technologies
  3. Canada Foundation for Innovation (CFI)
  4. U.S. Army Research Office
  5. McGill University
  6. U.S. Department of Energy Office of Basic Energy Sciences, Division of Materials Science and Engineering
  7. U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL 85000]

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We have investigated the correlated surface electronic and optical properties of [0001]-oriented epitaxial InN nanowires grown directly on silicon. By dramatically improving the epitaxial growth process, we have achieved, for the first time, intrinsic InN both within the bulk and at nonpolar InN surfaces. The near-surface Fermi-level was measured to be similar to 0.55 eV above the valence band maximum for undoped InN nanowires, suggesting the absence of surface electron accumulation and Fermi-level pinning. This result is in direct contrast to the problematic degenerate two-dimensional electron gas universally observed on grown surfaces of n-type degenerate InN. We have further demonstrated that the surface charge properties of InN nanowires, including the formation of two-dimensional electron gas and the optical emission characteristics can be precisely tuned through controlled n-type doping. At relatively high doping levels in this study, the near-surface Fermi-level was found to be pinned at,similar to 0.95-1.3 eV above the valence band maximum. Through these trends, well captured by the effective mass and ab initio materials modeling, we have unambiguously identified the definitive role of surface doping in tuning the surface charge properties of InN.

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