Journal
NANO LETTERS
Volume 12, Issue 5, Pages 2379-2385Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl3003528
Keywords
Silicon nanowires; mechanical properties; in situ TEM; elastic-plastic transition; e-beam irradiation; nanoshaping
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Funding
- Chinese National Nature Science Foundation
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It is generally accepted that silicon nanowires (Si NWs) exhibit linear elastic behavior until fracture without any appreciable plastic deformation. However, the plasticity of Si NWs can be triggered under low strain rate inside the transmission electron microscope (TEM). In this report, two in situ TEM experiments were conducted to investigate the electron-beam (e-beam) effect on the plasticity of Si NWs. An e-beam illuminating with a low current intensity would result in the bond re-forming processes, achieving the plastic deformation with a bent strain over 40% in Si NWs near the room temperature. In addition, an effective method was proposed to shape the Si NWs, where an e-beam-induced elastic-plastic (E-P) transition took place.
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