Journal
NANO LETTERS
Volume 12, Issue 12, Pages 6126-6132Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl303801u
Keywords
Nanoscale transport; crystalline silicon; in situ TEM; valence energy-filtered TEM; in situ X-ray diffraction; stress
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Convective transportation of materials in the solid state occurring in a prototype solid bilayer system of Al and Si with negligible mutual solubility has been directly imaged in real time at nanoscale using a valence energy-filtered transmission electron microscope. Such solid-state convection is driven by the stress gradient developing in the bilayer system due to the amorphous to crystalline phase transformation of the Si sublayer. The process is characterized by compression experienced in the Si phase crystallizing within the Al sublayer, as well as by the development of mushroom-shaped plumes of Al nanocrystals in the Si sublayer as a result of compressive stress relaxation and discrete, new nucleation of crystalline Al. The real-time, atomistic observation and the thus-obtained fundamental understanding of solid-state convection enable highly sophisticated applications of such a complex process in advanced fabrication and processing of nanomaterials and solid-state devices.
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