4.8 Article

Flexible Multilevel Resistive Memory with Controlled Charge Trap Band N-Doped Carbon Nanotubes

Journal

NANO LETTERS
Volume 12, Issue 5, Pages 2217-2221

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl204039q

Keywords

Resistive memory; flexible memory; multilevel memory; carbon nanotube; charge trap

Funding

  1. National Research Laboratory [R0A-2008-000-20057-0]
  2. Converging Research Center [2011K000642]
  3. Smart IT Convergence System Research Center
  4. MKE
  5. MEST of Republic of Korea
  6. National Research Foundation of Korea [R0A-2008-000-20057-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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B- and N-doped carbon nanotubes (CNTs) with controlled workfunctions were successfully employed as charge trap materials for solution processable, mechanically flexible, multilevel switching resistive memory. B- and N-doping systematically controlled the charge trap level and dispersibility of CNTs in polystyrene matrix. Consequently, doped CNT device demonstrated greatly enhanced nonvolatile memory performance (ON-OFF ratio >10(2), endurance cycle >10(2), retention time >10(5)) compared to undoped CNT device. More significantly, the device employing both B- and N-doped CNTs with different charge trap levels exhibited multilevel resistive switching with a discrete and stable intermediate state. Charge trapping materials with different energy levels offer a novel design scheme for solution processable multilevel memory.

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