Journal
NANO LETTERS
Volume 11, Issue 7, Pages 2779-2785Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl201074a
Keywords
ZnO nanowire; Piezotronic effect; resistive switching; memory; flexible electronics
Categories
Funding
- DARPA [HR0011-09-C-0142]
- Airforce
- BES DOE [DE-FG02-07ER46394]
- NSF [CMMI 0403671]
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We present the first piezoelectrically modulated resistive switching device based on piezotronic ZnO nanowire (NW), through which the write/read access of the memory cell is programmed via electromechanical modulation. Adjusted by the strain-induced polarization charges created at the semiconductor/metal interface under externally applied deformation by the piezoelectric effect, the resistive switching characteristics of the cell can be modulated in a controlled manner, and the logic levels of the strain stored in the cell can be recorded and read out, which has the potential for integrating with NEMS technology to achieve micro/nanosystems capable for intelligent and self-sufficient multidimensional operations.
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