4.8 Article

Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy

Journal

NANO LETTERS
Volume 11, Issue 8, Pages 3227-3231

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl201488g

Keywords

Graphene; Raman spectroscopy; thermal expansion coefficient; strain

Funding

  1. MEST [2011-0017605]
  2. MEST (Quantum Metamaterials Research Center) [R11-2008-053-01002-0, 2008-03670]
  3. National Research Foundation of Korea [2011-0017605, 2008-0062236, CG031501, 2008-2002744] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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The thermal expansion coefficient (TEC) of single-layer graphene is estimated with temperature-dependent Raman spectroscopy in the temperature range between 200 and 400 K. It is found to be strongly dependent on temperature but remains negative in the whole temperature range with a room temperature value of (-8.0 +/- 0.7) x 10(-6) K-1. The strain caused by the TEC mismatch between graphene and the substrate plays a crucial role in determining the physical properties of graphene, and hence its effect must be accounted for in the interpretation of experimental data taken at cryogenic or elevated temperatures.

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