4.8 Article

Local Electronic Properties of Graphene on a BN Substrate via Scanning Tunneling Microscopy

Journal

NANO LETTERS
Volume 11, Issue 6, Pages 2291-2295

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl2005115

Keywords

Graphene; boron nitride; STM; Moire

Funding

  1. Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Division, U.S. Department of Energy [DE-AC03-76SF0098]
  2. Office of Naval Research, MURI [N00014-09-1-1066]
  3. National Science Foundation [DMR-0906539]
  4. Swiss National Science Foundation [PBELP2-122886]
  5. Swiss National Science Foundation (SNF) [PBELP2-122886] Funding Source: Swiss National Science Foundation (SNF)
  6. Direct For Mathematical & Physical Scien [0906539] Funding Source: National Science Foundation
  7. Division Of Materials Research [0906539] Funding Source: National Science Foundation

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The use of boron nitride (BN) as a substrate for graphene nanodevices has attracted much interest since the recent report that BN greatly improves the mobility of charge carriers in graphene compared to standard SiO2 substrates. We have explored the local microscopic properties of graphene on a BN substrate using scanning tunneling microscopy. We find that BN substrates result in extraordinarily flat graphene layers that display microscopic Moire patterns arising from the relative orientation of the graphene and BN lattices. Gate-dependent dI/dV spectra of graphene on BN exhibit spectroscopic features that are sharper than those obtained for graphene on SiO2. We observe a significant reduction in local microscopic charge inhomogeneity for graphene on BN compared to graphene on SiO2.

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