4.8 Article

Nanoscale Switching Characteristics of Nearly Tetragonal BiFeO3 Thin Films

Journal

NANO LETTERS
Volume 10, Issue 7, Pages 2555-2561

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl101187a

Keywords

Ferroelectricity; multiferroics; piezoresponse force microscopy; morphotropic phase transition; spintronics; ferroelectric tunnel junction

Funding

  1. ONR [N00014-09-0119]
  2. Oak Ridge National Laboratory by the Division of Scientific User Facilities, U S Department of Energy
  3. State of Texas through the Texas Center for Superconductivity at the University of Houston

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We have investigated the nanoscale switching properties of strain-engineered BiFeO3 thin films deposited on LaAlO3 substrates using a combination of scanning probe techniques Polarized Raman spectral analysis indicates that the nearly tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry Through local switching-spectroscopy measurements and piezoresponse force microscopy. we provide clear evidence of ferroelectric switching of the tetragonal phase, but the polarization direction, and therefore its switching, deviates strongly from the expected (001) tetragonal axis We also demonstrate a large and reversible, electrically driven structural phase transition from the tetragonal to the rhombohedral polymorph in this material, which is promising for a plethora of applications

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