4.8 Article

Correlating the Nanostructure and Electronic Properties of InAs Nanowires

Journal

NANO LETTERS
Volume 10, Issue 5, Pages 1618-1622

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nl904053j

Keywords

Nanowire; InAs; quantum dot; defects; field effect mobility

Funding

  1. Sloan Foundation
  2. Packard Foundation
  3. Army Research Office [W911NF-08-1-0189]
  4. NSF [DMR-0819860]
  5. PRISM Imaging and Analysis Center
  6. NSF MRSEC
  7. Direct For Mathematical & Physical Scien
  8. Division Of Materials Research [GRANTS:14060168] Funding Source: National Science Foundation
  9. Division Of Materials Research
  10. Direct For Mathematical & Physical Scien [0819860] Funding Source: National Science Foundation

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The electronic properties and nanostructure of In As nanowires are correlated by creating multiple field effect transistors (FETs) on nanowires grown to have low and high defect density segments. 4.2 K carrier mobilities are similar to 4 x larger in the nominally defect free segments of the wire, We also find that dark field optical intensity is correlated with the mobility, suggesting a simple route for selecting wires with a low defect density. At low temperatures, FETs fabricated on high defect density segments of InAs nanowires showed transport properties consistent with single electron charging, even on devices with low resistance ohmic contacts. The charging energies obtained suggest quantum dot formation at defects in the wires. These results reinforce the importance of controlling the defect density in order to produce high quality electrical and optical devices using InAs nanowires.

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