Journal
NANO LETTERS
Volume 9, Issue 3, Pages 921-925Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl801656w
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Funding
- NSF [50725209, 60621091]
- MOST [2006AA03Z402, 2007CB936203]
- CAS of China
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We demonstrate the intrinsic memory function of ferroelectric field-effect transistors (FeFETs) based on an integration of individual single-walled carbon nanotubes (SWCNTs) and epitaxial ferroelectric films. In contrast to the previously reported charge-storage CNT-FET memories, whose operations are haunted by a lack of control over the charge traps, the present CNT-FeFETs exhibit a well-defined memory hysteresis loop Induced by the reversible remnant polarization of the ferroelectric films. Large memory windows similar to 4 V, data retention time up to 1 week, and ultralow, power consumption (energy per bit) of similar to femto-joule, are highlighted in this report. Further simulations and experimental results show that the memory device Is valid under operation voltage less than 1 V due to an electric-field enhancement effect induced by the ultrathin SWCNTs.
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