Ordered arrays of ZnO nanorods grown on periodically polarity-inverted surfaces

Periodically polarity inverted (PPI) ZnO templates were fabricated using molecular beam epitaxy by employing MgO buffer layers. The polarity of ZnO film was controlled by the transformation of crystal structure from hexagonal to rocksalt due to the thickness of the MgO buffer layers. The polarity of ZnO in the PPI template was confirmed by AFM and PRM measurement. Higher growth rate and lower current value under positive supplied voltage in the region of Zn-polar were measured with comparing to that of O-polar. Holographic lithographic technique was employed for the realization of submicron pattern of periodical inverted polar ZnO over large area. After reaction using a carbothermal reduction, spatially well-separated ZnO nanorods with pitch of submicron were only observed in the Zn-polar regions. The possible reason for the difference of surface characteristics was considered as being due to the configuration of dangling bonds according to polarity.