Nanoscale Mechanical Drumming Visualized by 4D Electron Microscopy

With four-dimensional (4D) electron microscopy, we report in situ imaging of the mechanical drumming of a nanoscale material. The single crystal graphite film is found to exhibit global resonance motion that is fully reversible and follows the same evolution after each initiating stress pulse. At early times, the motion appears chaotic showing the different mechanical modes present over the micron scale. At longer time, the motion of the thin film collapses into a well-defined fundamental frequency of 1.08 MHz, a behavior reminiscent of mode locking; the mechanical motion damps out after similar to 200 (/i)s mu and the oscillation has a cavity quality factor of 150. The resonance time is determined by the stiffness of the material, and for the 75 nm thick and 40 pm square specimen used here we determined Young's modulus to be 1.0 TPa for the in-plane stress-strain profile. Because of its real-time dimension, this 4D microscopy should have applications in the study of these and other types of materials structures.