4.7 Article

Single-step synthesis process of Ti3SiC2 ohmic contacts on 4H-SiC by sputter-deposition of Ti

Journal

SCRIPTA MATERIALIA
Volume 99, Issue -, Pages 53-56

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2014.11.025

Keywords

Silicon carbide; MAX phase; Physical vapor deposition; High temperature

Funding

  1. VINN Excellence Center in research and innovation on Functional Nanoscale Materials (FunMat) by the Swedish Governmental Agency for Innovation Systems
  2. Swedish Foundation for Strategic Research
  3. Synergy Grant FUNCASE, Functional Carbides and Advanced Surface Engineering

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We report a single-step procedure for growth of ohmic Ti3SiC2 on 4H-SiC by sputter-deposition of Ti at 960 degrees C, based on the Ti-SiC solid-state reaction during deposition. X-ray diffraction and electron microscopy show the growth of interfacial Ti3SiC2. The as-deposited contacts are ohmic, in contrast to multistep processes with deposition followed by rapid thermal annealing. This procedure also offers the possibility of direct synthesis of oxygen-barrier capping layers before exposure to air, potentially improving contact stability in high-temperature and high-power devices. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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