4.8 Article

Epitaxial growth of a monolayer WSe2-MoS2 lateral p-n junction with an atomically sharp interface

Journal

SCIENCE
Volume 349, Issue 6247, Pages 524-528

Publisher

AMER ASSOC ADVANCEMENT SCIENCE
DOI: 10.1126/science.aab4097

Keywords

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Funding

  1. King Abdullah University of Science and Technology (Saudi Arabia), Ministry of Science and Technology (MOST)
  2. Taiwan Consortium of Emergent Crystalline Materials (TCECM)
  3. Academia Sinica (Taiwan)
  4. Japan Science and Technology Agency research acceleration program
  5. TCECM
  6. MOST of Taiwan [NSC102-2119-M-009-002-MY3]
  7. Center for Interdisciplinary Science of Nation Chiao Tung University
  8. [AOARD-134137]

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Two-dimensional transition metal dichalcogenides (TMDCs) such as molybdenum sulfide MoS2 and tungsten sulfide WSe2 have potential applications in electronics because they exhibit high on-off current ratios and distinctive electro-optical properties. Spatially connected TMDC lateral heterojunctions are key components for constructing monolayer p-n rectifying diodes, light-emitting diodes, photovoltaic devices, and bipolar junction transistors. However, such structures are not readily prepared via the layer-stacking techniques, and direct growth favors the thermodynamically preferred TMDC alloys. We report the two-step epitaxial growth of lateral WSe2-MoS2 heterojunction, where the edge of WSe2 induces the epitaxial MoS2 growth despite a large lattice mismatch. The epitaxial growth process offers a controllable method to obtain lateral heterojunction with an atomically sharp interface.

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