4.4 Article

Reliability study of hermetic wafer level MEMS packaging with through-wafer interconnect

Related references

Note: Only part of the references are listed.
Article Engineering, Electrical & Electronic

Low-temperature wafer bonding: A study of void formation and influence on bonding strength

XX Zhang et al.

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS (2005)

Article Engineering, Manufacturing

Analysis of RF MEMS switch packaging process for yield improvement

LL Mercado et al.

IEEE TRANSACTIONS ON ADVANCED PACKAGING (2005)

Article Materials Science, Multidisciplinary

Low-cost wafer-level vacuum packaging for MEMS

R Gooch et al.

MRS BULLETIN (2003)