Journal
MICROSCOPY RESEARCH AND TECHNIQUE
Volume 75, Issue 11, Pages 1550-1556Publisher
WILEY
DOI: 10.1002/jemt.22099
Keywords
radiation damage; radiolysis; knock-on displacement; dose-limited resolution
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Funding
- Natural Science and Engineering Research Council of Canada
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Ionization damage (radiolysis) and knock-on displacement are compared in terms of scattering cross section and stopping power, for thin organic specimens exposed to the electrons in a TEM. Based on stopping power, which includes secondary processes, radiolysis is found to be predominant for all incident energies (10300 keV), even in materials containing hydrogen. For conducting inorganic specimens, knock-on displacement is the only damage mechanism but an electron dose exceeding 1000 C cm-2 is usually required. Ways of experimentally determining the damage mechanism (with a view to minimizing damage) are discussed. Microsc. Res. Tech., 2012. (c) 2012 Wiley Periodicals, Inc.
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