Journal
MICROSCOPY AND MICROANALYSIS
Volume 20, Issue 6, Pages 1764-1771Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927614013506
Keywords
scanning transmission electron microscopy (STEM); projective standard deviation; atom column fitting; image analysis; atomic resolution
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Funding
- Air Force Office of Scientific Research [FA9550-12-1-0456]
- Analytical Instrumentation Facility (AIF) at North Carolina State University
- State of North Carolina
- National Science Foundation
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Here, we report the development of an approach to map atomic resolution images into a convenient matrix representation. Through the combination of two-dimensional Gaussian fitting and the projective standard deviation, atom column locations are projected onto two noncollinear reference lattice vectors that are used to assign each a unique (i, j) matrix index. By doing so, straightforward atomic resolution image analysis becomes possible. Using practical examples, we demonstrate that the matrix representation greatly simplifies categorizing atom columns to different sublattices. This enables a myriad of direct analyses, such as mapping atom column properties and correlating long-range atom column pairs. MATLAB source code can be downloaded from https://github.com/subangstrom/aci.
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