☆ 4.5 Article

High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide

MICROSCOPY AND MICROANALYSIS (2014)

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Journal

MICROSCOPY AND MICROANALYSIS
Volume 20, Issue S3, Pages 1824-1825

Publisher

Cambridge University Press (CUP)
DOI: 10.1017/s143192761401085x

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Categories

Materials Science, Multidisciplinary

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