4.5 Article

Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy

Journal

MICROSCOPY AND MICROANALYSIS
Volume 19, Issue S2, Pages 980-981

Publisher

Cambridge University Press (CUP)
DOI: 10.1017/s1431927613006892

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