Journal
MICROSCOPY AND MICROANALYSIS
Volume 18, Issue 5, Pages 1155-1162Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S143192761200133X
Keywords
confined layer slip; in situ indentation; Cu-Nb interfaces
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Funding
- U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Division of Materials Science and Engineering
- LANL Directed Research and Development project [ER20110573]
- DOE's National Nuclear Security Administration [DE-AC04-94AL85000]
- DOE-BES
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In situ nanoindentation of a 30 nm Cu/20 nm Nb multilayer film in a transmission electron microscope revealed confined layer slip as the dominant deformation mechanism. Dislocations were observed to nucleate from the Cu-Nb interfaces in both layers. Dislocation glide was confined by interfaces to occur within each layer, without transmission across interfaces. Cu and Nb layers co-deformed to large plastic strains without cracking. These microscopy observations provide insights in the unit mechanisms of deformation, work hardening, and recovery in nanoscale metallic multilayers.
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