☆ 4.5 Article

High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA

MICROSCOPY AND MICROANALYSIS (2012)

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Journal

MICROSCOPY AND MICROANALYSIS
Volume 18, Issue S2, Pages 776-777

Publisher

Cambridge University Press (CUP)
DOI: 10.1017/s1431927612005739

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Categories

Materials Science, Multidisciplinary

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