☆ 4.5 Meeting Abstract

Challenges in Achieving High Resolution at Low Voltages in the SEM

MICROSCOPY AND MICROANALYSIS (2009)

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Journal

MICROSCOPY AND MICROANALYSIS
Volume 15, Issue -, Pages 660-661

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927609094185

Keywords

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Categories

Materials Science, Multidisciplinary Microscopy

Funding

  1. United States Department of Energy (DOE) [DE-AC0494AL85000]

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