☆ 4.5 Meeting Abstract

High Resolution TEM and Electron Diffraction Study of Graphene Layers

MICROSCOPY AND MICROANALYSIS (2009)

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Journal

MICROSCOPY AND MICROANALYSIS
Volume 15, Issue -, Pages 1168-1169

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927609098808

Keywords

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Categories

Materials Science, Multidisciplinary Microscopy

Funding

  1. SWAN
  2. GRC-NRI

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