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In situ environmental transmission electron microscopy to determine transformation pathways in supported Ni nanoparticles

Journal

MICRON
Volume 43, Issue 11, Pages 1188-1194

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.micron.2012.04.007

Keywords

Environmental TEM; Nickel; Nickel oxide; Partial oxidation of methane; In situ; Syngas; Phase transformations

Categories

Funding

  1. National Science Foundation [NSF-CBET-0553445]

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We have applied in situ environmental transmission electron microscopy (ETEM) to follow the dynamic phase transformations that take place in SiO2 supported Ni nanoparticles during oxidation and reduction processes. The gas environments used for in situ ETEM studies were relevant to partial oxidation of methane (POM) reaction. In the presence of the CH4 + O-2 gas mixture (in 2:1 ratio) at 400 degrees C. Ni transforms to NiO due to the high O-chemisorption energy. NiO void structures were formed during the oxidation because of the Kirkendall type process where diffusion of Ni cations along NiO grain boundaries is eight orders of magnitude greater than the diffusion of O anions. Reduction was performed under a CO + H-2 mixture at 400 degrees C (in 1:2 ratio) and also in the presence of CH4 at 500 degrees C. Particle reduction processes also takes place via the diffusion of Ni cations along the NiO grain boundaries leaving NiO on the surface of the nanoparticle. NiO is the phase that is present on the surface of the nanoparticle during the intermediate stage of reduction. (C) 2012 Elsevier Ltd. All rights reserved.

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