Journal
MICROFLUIDICS AND NANOFLUIDICS
Volume 6, Issue 5, Pages 589-598Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s10404-008-0331-3
Keywords
Microfluidics; Current leakage; PDMS; Particle trapping/concentration; AC pumping
Funding
- NSF [CBET-0643583]
- DoD [W81XWH07-1-0507]
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Poly(dimethylsiloxane) (PDMS) is usually considered as a dielectric material and the PDMS microchannel wall can be treated as an electrically insulated boundary in an applied electric field. However, in certain layouts of microfluidic networks, electrical leakage through the PDMS microfluidic channel walls may not be negligible, which must be carefully considered in the microfluidic circuit design. In this paper, we report on the experimental characterization of the electrical leakage current through PDMS microfluidic channel walls of different configurations. Our numerical and experimental studies indicate that for tens of microns thick PDMS channel walls, electrical leakage through the PDMS wall could significantly alter the electrical field in the main channel. We further show that we can use the electrical leakage through the PDMS microfluidic channel wall to control the electrolyte flow inside the microfluidic channel and manipulate the particle motion inside the microfluidic channel. More specifically, we can trap individual particles at different locations inside the microfluidic channel by balancing the electroosmotic flow and the electrophoretic migration of the particle.
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