Journal
MICROELECTRONICS RELIABILITY
Volume 54, Issue 12, Pages 2843-2848Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2014.07.137
Keywords
Ageing; Degradation; Relaxation function; Thick films; Ceramics
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The mathematical models of thermally-induced degradation processes in solids with nano- and micro-scale topological disordering bulk and thick-film ceramic composites based on mixed transition-metal manganites are considered. It was shown that degradation transformations in these materials are best described by stretched or suppressed exponential relaxation function. The stretched exponential degradation kinetics is proper to own degradation transformations in such one-type systems as bulk ceramics and multilayered thick-film structures. The mechanism of degradation transformations in one-layered thick films, including two or more different on their origin elementary are described by suppressed exponential kinetics. (C) 2014 Elsevier Ltd. All rights reserved.
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