Journal
MICROELECTRONICS RELIABILITY
Volume 52, Issue 9-10, Pages 2487-2489Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2012.06.150
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In this work, the effect of reverse bias stress tests on Dye Solar Cells (DSCs) based on N719 dye was investigated in detail using resonant micro-Raman spectroscopy. First the Raman lines were assigned to vibrations from the different constituents in a fresh solar cell. Then the mechanism of thiocyanato (SCN-) loss under stress conditions was reported. (C) 2012 Elsevier Ltd. All rights reserved.
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