4.4 Article

Fabrication of inverse micro/nano pyramid structures using soft UV-NIL and wet chemical methods for residual layer removal and Si-etching

Journal

MICROELECTRONIC ENGINEERING
Volume 110, Issue -, Pages 403-407

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.mee.2013.02.098

Keywords

Nanoimprint; Residual layer etching with wet chemical; Micro/nano inverse pyramids

Funding

  1. Project NILTEX, EUROPAISCHE UNION Europaischer Fonds fur regionale Entwicklung, Investition in unsere Zukunft

Ask authors/readers for more resources

In this study we present a novel and simple fabrication method for micro- and nano-scale inverse pyramidal structures by a combination of soft UV-NIL and wet chemical etchings. The unique feature of our method is the absence of a RIE process, which is usually applied for removal of residual layer. This is achieved by modifying the imprint resist with an O-2-plasma in asher and subsequent wet etching of residual layer by diluted HF. Combined with conventional anisotropic wet etching step with KOH/IPA, our method allows cost effective fabrication of inverse pyramidal structures on Si-substrate in batch process. Such structures in nano- and micro scale are particularly suitable for light management in photovoltaic, solid state lighting and silicon based photonic. (C) 2013 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available