Journal
MICROCHIMICA ACTA
Volume 161, Issue 3-4, Pages 455-458Publisher
SPRINGER WIEN
DOI: 10.1007/s00604-007-0906-9
Keywords
Kossel technique; lattice source interferences; polycapillary lens; X-ray fluorescence analysis; Laue method
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We present, for the first time, X-ray fluorescence excited Kossel patterns in the scanning electron microscope by way of a compact X-ray tube and a focusing polycapillary lens. Both the diffraction geometry in transmission and in back reflection can be carried out. The way is paved for the advantageous combination of micro-X-ray fluorescence analysis, the Laue method, and the X-ray fluorescence excited Kossel micro-diffraction with the high lateral resolution of the electron microscopy.
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