4.5 Article

Measuring the loss tangent of polymer materials with atomic force microscopy based methods

Journal

MEASUREMENT SCIENCE AND TECHNOLOGY
Volume 25, Issue 5, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0957-0233/25/5/055402

Keywords

scanning probe microscopy; viscoelastic property; nanomechanical

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Atomic force microscopy (AFM) quantitatively maps viscoelastic parameters of polymers on the nanoscale by several methods. The loss tangent, the ratio between dissipated and stored energy, was measured on a blend of thermoplastic polymer materials by a dynamic contact method, contact resonance, and by a recently developed loss tangent measurement by amplitude modulation AFM. Contact resonance measurements were performed both with dual AC resonance tracking and band excitation (BE), allowing for a reference- free measurement of the loss tangent. Amplitude modulation AFM was performed where a recent interpretation of the phase signal under certain operating conditions allows for the loss tangent to be calculated. The loss tangent measurements were compared with values expected from time- temperature superposed frequency- dependent dynamical mechanical curves of materials and reveal that the loss tangents determined from the BE contact resonance method provide the most accurate values.

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