Journal
MEASUREMENT SCIENCE AND TECHNOLOGY
Volume 25, Issue 4, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-0233/25/4/044015
Keywords
atomic force microscopy; force spring determination; mechanical properties imaging; torsional cantilever oscillations; time-resolved tapping mode; force spectroscopy
Funding
- Electrotechnical Institute
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One of the most important diagnostic features of atomic force microscopy is the measurement of mechanical properties of the surface. Among a wide spectra of measuring techniques, the methods utilizing torsional oscillations of the cantilever provide high speed mapping of properties such as the stiffness, adhesion, snap-in force and energy dissipation. In order to perform quantitative measurements, one must determine the spring constant of the cantilever. In this paper, we present the utilization of high-accuracy normal force calibration structures, allowing the procedure to be carried out easily and quickly. Additionally, the results of tests confirming the efficiency of the method are presented.
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