4.5 Article

A methodology for high resolution digital image correlation in high temperature experiments

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 86, Issue 3, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4915345

Keywords

-

Funding

  1. National Science Foundation (NSF) [DGE-1148903, CMMI-1351705]
  2. Directorate For Engineering
  3. Div Of Civil, Mechanical, & Manufact Inn [1351705] Funding Source: National Science Foundation

Ask authors/readers for more resources

We propose a methodology for performing high resolution Digital Image Correlation (DIC) analysis during high-temperature mechanical tests. Specifically, we describe a technique for producing a stable, high-quality pattern on metal surfaces along with a simple optical system that uses a visible-range camera and a long-range microscope. The results are analyzed with a high-quality open-source DIC software developed by us. Using the proposed technique, we successfully acquired high-resolution strain maps of the crack tip field in a nickel superalloy sample at 1000 degrees C. (C) 2015 AIP Publishing LLC.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available