Journal
MATERIALS TODAY
Volume 15, Issue 9, Pages 378-386Publisher
ELSEVIER SCI LTD
DOI: 10.1016/S1369-7021(12)70164-5
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Funding
- Australian Microscopy & Microanalysis Research Facility (AMMRF) at The University of Sydney
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This review addresses new developments in the emerging area of atom probe crystallography, a materials characterization tool with the unique capacity to reveal both composition and crystallographic structure at the atomic scale. This information is crucial for the manipulation of microstructure for the design of both structural and functional materials with optimized mechanical, electric, optoelectronic, magnetic, or superconducting properties that will find application in, for example, nanoelectronics or energy generation. The ability to extract crystallographic information from 30 atomistic reconstruction has exciting potential synergies with modern modeling techniques, blending experimental and computational methods to extend our insight.
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